Degradation and breakdown of thin silicon dioxide films...

Degradation and breakdown of thin silicon dioxide films under dynamic electrical stress

Nafria, M., Sune, J., Yelamos, D., Aymerich, X.
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Volume:
43
Year:
1996
Language:
english
Pages:
12
DOI:
10.1109/16.544394
File:
PDF, 1.43 MB
english, 1996
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