![](/img/cover-not-exists.png)
Impact of polysilicon emitter interfacial layer engineering on the 1/f noise of bipolar transistors
Simoen, E., Decoutere, S., Cuthbertson, A., Claeys, C.L., Deferm, L.Volume:
43
Year:
1996
Language:
english
Pages:
8
DOI:
10.1109/16.544419
File:
PDF, 946 KB
english, 1996