Noise and transit time in ungated FET structures

IEEE Transactions on Electron Devices 1997 Vol. 44; Iss. 12

Noise and transit time in ungated FET structures

Mateos, J., Gonzalez, T., Pardo, D., Tadyszak, P., Danneville, F., Cappy, A.
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Volume:
44
Year:
1997
Language:
english
Pages:
8
DOI:
10.1109/16.644625
File:
PDF, 163 KB
english, 1997
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