Gate engineering for deep-submicron CMOS transistors

IEEE Transactions on Electron Devices 1998 Vol. 45; Iss. 6

Gate engineering for deep-submicron CMOS transistors

Bin Yu, Dong-Hyuk Ju, Wen-Chin Lee, Kepler, N., Tsu-Jae King, Chenming Hu
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Volume:
45
Year:
1998
Language:
english
Pages:
10
DOI:
10.1109/16.678529
File:
PDF, 360 KB
english, 1998
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