![](/img/cover-not-exists.png)
Time-dependent-dielectric-breakdown measurements of thermal oxides on n-type 6H-SiC
Mathur, M.M., Cooper, J.A., Jr.Volume:
46
Year:
1999
Language:
english
Pages:
5
DOI:
10.1109/16.748871
File:
PDF, 150 KB
english, 1999