Characterization and modeling of second breakdown in...

IEEE Transactions on Electron Devices 1991 Vol. 38; Iss. 9

Characterization and modeling of second breakdown in NMOST's for the extraction of ESD-related process and design parameters

Amerasekera, A., van Roozendaal, L., Bruines, J., Kuper, F.
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Volume:
38
Year:
1991
Language:
english
Pages:
8
DOI:
10.1109/16.83744
File:
PDF, 819 KB
english, 1991
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