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Capacitance reconstruction from measured C-V in high leakage, nitride/oxide MOS
Chang-Hoon Choi, Wu, Y., Jung-Suk Goo, Zhiping Yu, Dutton, R.W.Volume:
47
Year:
2000
Language:
english
Pages:
8
DOI:
10.1109/16.870559
File:
PDF, 251 KB
english, 2000