Capacitance reconstruction from measured C-V in high...

Capacitance reconstruction from measured C-V in high leakage, nitride/oxide MOS

Chang-Hoon Choi, Wu, Y., Jung-Suk Goo, Zhiping Yu, Dutton, R.W.
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Volume:
47
Year:
2000
Language:
english
Pages:
8
DOI:
10.1109/16.870559
File:
PDF, 251 KB
english, 2000
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