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Modeling of direct tunneling current through gate dielectric stacks
Mudanai, S., Yang-Yu Fan, Qiqing Ouyang, Tasch, A.F., Banerjee, S.K.Volume:
47
Year:
2000
Language:
english
Pages:
7
DOI:
10.1109/16.870561
File:
PDF, 182 KB
english, 2000