![](/img/cover-not-exists.png)
Consistent model for the hot-carrier degradation in n-channel and p-channel MOSFETs
Heremans, P., Bellens, R., Groeseneken, G., Maes, H.E.Volume:
35
Year:
1988
Language:
english
Pages:
16
DOI:
10.1109/16.8794
File:
PDF, 1.79 MB
english, 1988