Survey of reliability studies of consecutive-k-out-of-n:F...

IEEE Transactions on Reliability 1995 Vol. 44; Iss. 1

Survey of reliability studies of consecutive-k-out-of-n:F and related systems

Chao, M.T., Fu, J.C., Koutras, M.V.
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Volume:
44
Year:
1995
Language:
english
Pages:
8
DOI:
10.1109/24.376531
File:
PDF, 785 KB
english, 1995
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