Volume 44; Issue 1

IEEE Transactions on Reliability

Volume 44; Issue 1

1

Electrical overstress and electrostatic discharge

Diaz, C., Kang, S.M., Duvvury, C.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 472 KB

english, 1995

2

Reliability comparisons for plastic-encapsulated microcircuits

Baker, B., Martin, S.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 176 KB

english, 1995

3

Demonstrated reliability of plastic-encapsulated microcircuits for missile applications

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 593 KB

english, 1995

4

Assembly-level reliability: a methodology for effective manufacturing of IC packages

Nguyen, L.T., Finnell, J.R., Singh, K.M.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 506 KB

english, 1995

5

Modeling and maximizing burn-in effectiveness

Chien, W.-T.K., Way Kuo

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 487 KB

english, 1995

6

Determining the duration of a demonstration life-test before all units fail

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 429 KB

english, 1995

7

Weibull accelerated life testing with unreported early failures

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 455 KB

english, 1995

8

Fault-tree analysis: a knowledge-engineering approach

Geymayr, J.A.B., Ebecken, N.F.F.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 877 KB

english, 1995

9

Reliability analysis of complex models using SURE bounds

Nicol, D.M., Palumbo, D.L.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 855 KB

english, 1995

10

A reliability model for real-time rule-based expert systems

Ing-Ray Chen, Tawei Tsao

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 918 KB

english, 1995

11

Genetic-algorithm-based reliability optimization for computer network expansion

Kumar, A., Pathak, R.M., Gupta, Y.P.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 888 KB

english, 1995

12

Dependent and multimode failures in reliability evaluation of extra-stage shuffle-exchange MINs

Trahan, J.L., Wang, D.X., Rai, S.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 1.18 MB

english, 1995

13

A combinatorial approach to modeling imperfect coverage

Doyle, S.A., Dugan, J.B., Patterson-Hine, F.A.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 683 KB

english, 1995

14

Comment on: "Component relevancy in multistate reliability models"

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 174 KB

english, 1995

15

Effect of testing techniques on software reliability estimates obtained using a time-domain model

Mei-Hwa Chen, Mathur, A.P., Rego, V.J.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 664 KB

english, 1995

16

Mixture models for reliability of software with imperfect debugging: identifiability of parameters

Fakhre-Zakeri, I., Slud, E.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 779 KB

english, 1995

17

Computation in faulty stars [hypercube networks]

Bagherzadeh, N., Dowd, M.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 615 KB

english, 1995

18

Survey of reliability studies of consecutive-k-out-of-n:F and related systems

Chao, M.T., Fu, J.C., Koutras, M.V.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 785 KB

english, 1995

19

An O(k3·log(n/k)) algorithm for the consecutive-k-out-of-n:F system

Hwang, F.K., Wright, P.E.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 293 KB

english, 1995

20

An O(n·(log2(n))2) algorithm for computing the reliability of k-out-of-n:G and k-to-l-out-of-n:G systems

Belfore, L.A., II

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 428 KB

english, 1995

21

Comment on: Reliability of k-out-of-n:G systems with imperfect fault-coverage

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 162 KB

english, 1995

22

A new framework for part failure-rate prediction models

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 732 KB

english, 1995

23

Sensitivity and uncertainty analysis of Markov-reward models

Haverkort, B.R., Meeuwissen, A.M.H.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 717 KB

english, 1995

24

Time-varying failure rates in the availability and reliability analysis of repairable systems

Hassett, T.F., Dietrich, D.L., Szidarovszky, F.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 335 KB

english, 1995