A Bayes approach to step-stress accelerated life testing

IEEE Transactions on Reliability 1996 Vol. 45; Iss. 3

A Bayes approach to step-stress accelerated life testing

Rene van Dorp, J., Mazzuchi, T.A., Fornell, G.E., Pollock, L.R.
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Volume:
45
Year:
1996
Language:
english
Pages:
8
DOI:
10.1109/24.537021
File:
PDF, 675 KB
english, 1996
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