Volume 45; Issue 3

IEEE Transactions on Reliability

Volume 45; Issue 3

1

Some results on discrete mean residual life

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 209 KB

english, 1996

2

Engineering notion of mean-residual-life and hazard-rate for finite populations with known distributions

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 454 KB

english, 1996

3

Estimating the cumulative downtime distribution of a highly reliable component

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 488 KB

english, 1996

4

A system-based component test plan for a series system, with type-II censoring

Rajgopal, J., Mazumdar, M.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 338 KB

english, 1996

5

Development test programs for 1-shot systems: 2-state reliability and binary development-test results

Mu-Yeh Huang, McBeth, D., Vardeman, S.B.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 630 KB

english, 1996

6

Proportional hazards modeling of time-dependent covariates using linear regression: a case study [mine power cable reliability]

Kumar, D., Westberg, U.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 611 KB

english, 1996

7

Computational algebra applications in reliability theory

Hartless, G., Leemis, L.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 560 KB

english, 1996

8

The use of precautionary loss functions in risk analysis

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 330 KB

english, 1996

9

Time-constrained scheduling during high-level synthesis of fault-secure VLSI digital signal processors

Karri, R., Orailoglu, A.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 1.05 MB

english, 1996

10

A cut-based method for terminal-pair reliability

Chen, Y.G., Yuang, M.C.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 485 KB

english, 1996

11

Applications and extensions of the chains-of-rare-events model

Barraza, R., Cernuschi-Frias, B., Cernuschi, F.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 409 KB

english, 1996

12

A linear-time algorithm to find modules of fault trees

Dutuit, Y., Rauzy, A.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 376 KB

english, 1996

13

An efficient stiffness-insensitive method for transient analysis of Markov availability models

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 284 KB

english, 1996

14

A fast algorithm for repair-depot reliability-evaluation

Linton, D.G., Khajenoori, S., Yi, Y., Hebert, G.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 317 KB

english, 1996

15

Age-dependent models for evaluating risks and costs of surveillance and maintenance of components

Martorell, S., Munoz, A., Serradell, V.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 764 KB

english, 1996

16

Fault injection for formal testing of fault tolerance

Avresky, D., Arlat, J., Laprie, J.-C., Crouzet, Y.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 1.35 MB

english, 1996

17

Using neural networks to predict software faults during testing

Khoshgoftaar, T.M., Szabo, R.M.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 706 KB

english, 1996

18

Generalized linear models in software reliability: parametric and semi-parametric approaches

El Aroui, M.-A., Lavergne, C.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 602 KB

english, 1996

19

Bayes estimation for the Pareto failure-model using Gibbs sampling

Tiwari, R.C., Yizhou Yang, Zalkikar, J.N.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 408 KB

english, 1996

20

Hierarchical Bayes estimation for the exponential-multinomial model in reliability and competing risks

Papadopoulos, A.S., Tiwari, R.C., Zalkikar, J.N.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 488 KB

english, 1996

21

Predictive Bayes design of Scram systems: related mathematics and philosophical implications

Clarotti, C.A., Spizzichino, F.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 469 KB

english, 1996

22

A Bayes approach to step-stress accelerated life testing

Rene van Dorp, J., Mazzuchi, T.A., Fornell, G.E., Pollock, L.R.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 675 KB

english, 1996

23

A Bayes ranking of survival distributions using accelerated or correlated data

Zimmer, W.J., Deely, J.J.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 516 KB

english, 1996

24

A reliability-growth model in a Bayes-decision framework

Calabria, R., Guida, M., Pulcini, G.

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 481 KB

english, 1996

25

Rituals- The Quick & Easy Way

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 122 KB

english, 1996

26

Predicting Field-Performance of Automotive Electronic Products

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 122 KB

english, 1996

27

What Is Software Failure?

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 213 KB

english, 1996

28

Knowledge vs Understanding

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 91 KB

english, 1996

29

Comment on the Editorial: What Was Measured?!

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 115 KB

english, 1996

30

Difficulties With Reliability Incentives

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 136 KB

english, 1996

31

Real Reliability

Journal:

IEEE Transactions on Reliability

Year:

1996

Language:

english

File:

PDF, 136 KB

english, 1996