Statistical phenomena associated with Si-SiO2interface...

Statistical phenomena associated with Si-SiO2interface states

Nicollian, E.H., Goetzberger, A.
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Volume:
13
Year:
1966
Language:
english
Pages:
1
DOI:
10.1109/t-ed.1966.15784
File:
PDF, 192 KB
english, 1966
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