Resistivity and mobility of GaP at 300 K

IEEE Transactions on Electron Devices 1983 Vol. 30; Iss. 7

Resistivity and mobility of GaP at 300 K

Kao, Y.C., Eknoyan, O.
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Volume:
30
Year:
1983
Language:
english
Pages:
3
DOI:
10.1109/t-ed.1983.21221
File:
PDF, 305 KB
english, 1983
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