Theoretical analysis on threshold characteristics of...

Theoretical analysis on threshold characteristics of surface-channel MOSFET's fabricated on a buried Oxide

Omura, Y., Nakashima, S., Izumi, K.
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Volume:
30
Year:
1983
Language:
english
Pages:
7
DOI:
10.1109/t-ed.1983.21427
File:
PDF, 663 KB
english, 1983
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