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The MISIM-FET in thin semiconductor layers: Depletion-approximation model of I-V characteristics
Barth, P.W., Apte, P.R., Angell, J.B.Volume:
30
Year:
1983
Language:
english
Pages:
10
DOI:
10.1109/t-ed.1983.21436
File:
PDF, 1.10 MB
english, 1983