Trapping-enhanced temperature variation of the threshold...

IEEE Transactions on Electron Devices 1986 Vol. 33; Iss. 6

Trapping-enhanced temperature variation of the threshold voltage of GaAs MESFET's

Chung-Hsu Chen, Shur, M., Peczalski, A.
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Volume:
33
Year:
1986
Language:
english
Pages:
7
DOI:
10.1109/t-ed.1986.22570
File:
PDF, 596 KB
english, 1986
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