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Analysis and modeling of floating-gate EEPROM cells
Kolodny, A., Nieh, S.T.K., Eitan, B., Shappir, J.Volume:
33
Year:
1986
Language:
english
Pages:
10
DOI:
10.1109/t-ed.1986.22576
File:
PDF, 1023 KB
english, 1986