Determining the location of localized defect in the...

Determining the location of localized defect in the perpendicular junction configuration with the use of electron beam induced current

Poh Chin Phua, Ong, V.K.S.
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Volume:
49
Year:
2002
Language:
english
Pages:
11
DOI:
10.1109/ted.2002.804703
File:
PDF, 776 KB
english, 2002
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