Maximum allowable bulk defect density for...

IEEE Transactions on Electron Devices 2002 Vol. 49; Iss. 11

Maximum allowable bulk defect density for generation-recombination noise-free device operation

Fan-Chi Hou, Bosman, G., Law, M.E.
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Volume:
49
Year:
2002
Language:
english
Pages:
3
DOI:
10.1109/ted.2002.804705
File:
PDF, 246 KB
english, 2002
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