Two types of neutral electron traps generated in the gate...

IEEE Transactions on Electron Devices 2002 Vol. 49; Iss. 11

Two types of neutral electron traps generated in the gate silicon dioxide

Wei Dong Zhang, Zhang, J.F., Lalor, A., Burton, D., Groeseneken, G.V., Degraeve, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
49
Year:
2002
Language:
english
Pages:
8
DOI:
10.1109/ted.2002.804709
File:
PDF, 480 KB
english, 2002
Conversion to is in progress
Conversion to is failed