Role of positive trapped charge in stress-induced leakage...

IEEE Transactions on Electron Devices 2002 Vol. 49; Iss. 11

Role of positive trapped charge in stress-induced leakage current for flash EEPROM devices

Tahui Wang, Nian-Kai Zous, Chih-Chieh Yeh
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Volume:
49
Year:
2002
Language:
english
Pages:
7
DOI:
10.1109/ted.2002.804711
File:
PDF, 507 KB
english, 2002
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