Experimental evidence for nonlucky electron model effect in...

IEEE Transactions on Electron Devices 2002 Vol. 49; Iss. 11

Experimental evidence for nonlucky electron model effect in 0.15-μm NMOSFETs

Sang-Gi Lee, Jeong-Mo Hwang, Hi-Deok Lee
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Volume:
49
Year:
2002
Language:
english
Pages:
6
DOI:
10.1109/ted.2002.804714
File:
PDF, 531 KB
english, 2002
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