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Monte Carlo simulation and measurement of nanoscale n-MOSFETs
Bufler, F.M., Asahi, Y., Yoshimura, H., Zechner, C., Schenk, A., Fichtner, W.Volume:
50
Year:
2003
Language:
english
Pages:
7
DOI:
10.1109/ted.2002.808420
File:
PDF, 366 KB
english, 2003