Impact ionization measurements and modeling for power PHEMT

IEEE Transactions on Electron Devices 2003 Vol. 50; Iss. 2

Impact ionization measurements and modeling for power PHEMT

Baksht, T., Solodky, S., Leibovitch, M., Bunin, G., Shapira, Y.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
50
Year:
2003
Language:
english
Pages:
7
DOI:
10.1109/ted.2003.809038
File:
PDF, 628 KB
english, 2003
Conversion to is in progress
Conversion to is failed