Localized oxide degradation in ultrathin gate dielectric...

Localized oxide degradation in ultrathin gate dielectric and its statistical analysis

Wei Yip Loh, Byung Jin Cho, Ming Fu Li, Chan, D.S.H., Chew Hoe Ang, Jia Zhen Zheng, Dim Lee Kwong
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Volume:
50
Year:
2003
Language:
english
Pages:
6
DOI:
10.1109/ted.2003.812105
File:
PDF, 362 KB
english, 2003
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