Volume 50; Issue 4

IEEE Transactions on Electron Devices

Volume 50; Issue 4

1

Capacitance of abrupt one-sided heterojunctions

Sheinman, B., Ritter, D.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 345 KB

english, 2003

2

Novel ultrahigh-density flash memory with a stacked-surrounding gate transistor (S-SGT) structured cell

Endoh, T., Kinoshita, K., Tanigami, T., Wada, Y., Sato, K., Yamada, K., Yokoyama, T., Takeuchi, N., Tanaka, K., Awaya, N., Sakiyama, K., Masuoka, F.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 654 KB

english, 2003

3

Modeling of parasitic capacitances in deep submicrometer conventional and high-K dielectric MOS transistors

Mohapatra, N.R., Desai, M.P., Narendra, S.G., Ramgopal Rao, V.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 565 KB

english, 2003

4

Shot-noise reduction in multiple-quantum-well resonant tunneling diodes

Pouyet, V., Brown, E.R.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 440 KB

english, 2003

5

Characterization of process-induced mobile ions on the data retention in flash memory

Liou, J.J.-W., Chih-Jen Huang, Hwi-Huang Chen, Hong, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 306 KB

english, 2003

6

Current limited stresses of SiO2 gate oxides with conductive atomic force microscope

Porti, M., Nafria, M., Aymerich, X.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.46 MB

english, 2003

7

DC, RF, and microwave noise performance of AlGaN-GaN field effect transistors dependence of aluminum concentration

Wu Lu, Kumar, V., Piner, E.L., Adesida, I.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 423 KB

english, 2003

8

1.5-nm gate oxide CMOS on [110] surface-oriented Si substrate

Momose, H.S., Ohguro, T., Kojima, K., Nakamura, S., Toyoshima, Y.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 777 KB

english, 2003

9

A possible explanation for high quantum efficiency of PtSi/porous Si Schottky detectors

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 517 KB

english, 2003

10

Design and performance of tunnel collector HBTs for microwave power amplifiers

Welty, R.J., Mochizuki, K., Lutz, C.R., Welser, R.E., Asbeck, P.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 415 KB

english, 2003

11

Improve the luminous efficiency of AC plasma display by high-frequency driving on address electrodes

Yi-Mei Li, Chern-Lin Chen, Horng-Bin Hsu

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.21 MB

english, 2003

12

Silicon planar technology for single-photon optical detectors

Sciacca, E., Giudice, A.C., Sanfilippo, D., Zappa, F., Lombardo, S., Consentino, R., Di Franco, C., Ghioni, M., Fallica, G., Bonanno, G., Cova, S., Rimini, E.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 955 KB

english, 2003

13

Deep-depletion high-frequency capacitance-voltage responses under photonic excitation and distribution of interface states in MOS capacitors

Kim, D.M., Song, S.J., Kim, H.T., Kang, D.W., Song, S.H., Min, K.S.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 349 KB

english, 2003

14

Optimization of AuGe-Ni-Au ohmic contacts for GaAs MOSFETs

Hung-Cheng Lin, Senanayake, S., Keh-Yung Cheng, Minghwei Hong, Kwo, J.R., Bin Yang, Mannaerts, J.P.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 548 KB

english, 2003

15

Call for papers - Wireless Technology: Models, Designs and Applications

Chimenton, A., Olivo, P.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 503 KB

english, 2003

16

Call for papers: ICEAA - IEEE APWC

Chimenton, A., Olivo, P.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 366 KB

english, 2003

17

A simple and effective ac pixel driving circuit for active matrix OLED

Si Yujuan, Zhao Yi, Chen Xinfa, Liu Shiyong

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 297 KB

english, 2003

18

A new method to characterize border traps in submicron transistors using hysteresis in the drain current

ManjulaRani, K.N., Rao, V.R., Vasi, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 442 KB

english, 2003

19

240-325-GHz GaAs CW fundamental-mode TUNNETT diodes fabricated with molecular layer epitaxy

Plotka, P., Jun Nishizawa, Kurabayashi, T., Makabe, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 540 KB

english, 2003

20

Optimal global interconnects for GSI

Naeemi, A., Venkatesan, R., Meindl, J.D.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 497 KB

english, 2003

21

Localized oxide degradation in ultrathin gate dielectric and its statistical analysis

Wei Yip Loh, Byung Jin Cho, Ming Fu Li, Chan, D.S.H., Chew Hoe Ang, Jia Zhen Zheng, Dim Lee Kwong

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 362 KB

english, 2003

22

Electrical characteristics and reliability of UV transparent Si3N4 metal-insulator-metal (MIM) capacitors

Bolam, R.J., Ramachandran, V., Coolbaugh, D., Watson, K.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 656 KB

english, 2003

23

High-performance strained-SOI CMOS devices using thin film SiGe-on-insulator technology

Mizuno, T., Sugiyama, N., Tezuka, T., Numata, T., Takagi, S.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 643 KB

english, 2003

24

1/f noise in Si0.8Ge0.2 pMOSFETs under Fowler-Nordheim stress

Young-Joo Song, Jung-Wook Lim, Bongki Mheen, Sang-Hoon Kim, Hyun-Chul Bae, Jin-Young Kang, Jeong-Hoon Kim, Jong-In Song, Kyung-Wan Park, Kyu-Hwan Shim

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 413 KB

english, 2003

25

Accurate electrical characterization of forward AC behavior of real semiconductor diode: giant negative capacitance and nonlinear interfacial layer

Wang, C.D., Zhu, C.Y., Zhang, G.Y., Shen, J., Li, L.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 260 KB

english, 2003

26

Static characteristics of a-Si:H dual-gate TFTs

Servati, P., Karim, K.S., Nathan, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 956 KB

english, 2003

27

Characterization of the tunneling insulator in MIM cathodes by low-stress I-V measurement

Suzuki, M., Sagawa, M., Kusunoki, T., Tsuji, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 360 KB

english, 2003

28

Auger recombination-enhanced hot carrier degradation in nMOSFETs with a forward substrate bias

Tsai, C.-W., Chen, M.-C., Ku, S.-H., Tahui Wang

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 333 KB

english, 2003

29

A SPICE model for thin-film transistors fabricated on grain-enhanced polysilicon film

Jagar, S., Cheng, C.F., Shengdong Zhang, Hongmei Wang, Poon, M.C., Kok, C.W., Chan, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 563 KB

english, 2003

30

Silicon epitaxial layer recombination and generation lifetime characterization

Schroder, D.K., Choi, B.D., Kang, S.G., Ohashi, W., Kitahara, K., Opposits, G., Pavelka, T., Benton, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 352 KB

english, 2003

31

Slow transients observed in AlGaN/GaN HFETs: effects of SiNx passivation and UV illumination

Koley, G., Tilak, V., Eastman, L.F., Spencer, M.G.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 359 KB

english, 2003

32

MEMS fingerprint sensor immune to various finger surface conditions

Sato, N., Machida, K., Morimura, H., Shigematsu, S., Kudou, K., Yano, M., Kyuragi, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 2.40 MB

english, 2003

33

Performance projections of scaled CMOS devices and circuits with strained Si-on-SiGe channels

Fossum, J.G., Weimin Zhang

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 552 KB

english, 2003

34

Field dependence of impact ionization coefficients in In0.53Ga0.47As

Ng, J.S., Tan, C.H., David, J.P.R., Hill, G., Rees, G.J.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 313 KB

english, 2003

35

Physical mechanisms on the abnormal gate-leakage currents in pseudomorphic high electron mobility transistors

Cho, S.D., Kim, H.T., Kim, D.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 420 KB

english, 2003

36

Gain increases through end of life in traveling wave tubes

Goebel, D.M., Schneider, A.C., Menninger, W.L., Weekley, J.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 422 KB

english, 2003

37

Substrate-triggered technique for on-chip ESD protection design in a 0.18-μm salicided CMOS process

Ming-Dou Ker, Tung-Yang Chen

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 788 KB

english, 2003

38

Nickel induced crystallization of α-Si gate electrode at 500°C and MOS capacitor reliability

Joshi, A.R., Saraswat, K.C.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 422 KB

english, 2003

39

Impact of gate-induced drain leakage on retention time distribution of 256 Mbit DRAM with negative wordline bias

Minchen Chang, Jengping Lin, Shih, S.N., Tieh-Chiang Wu, Brady Huang, Jen Yang, Lee, P.-I.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 657 KB

english, 2003

40

Hot-carrier stressing of NPN polysilicon emitter bipolar transistors incorporating fluorine

Sheng, S.R., McKinnon, W.R., McAlister, S.P., Storey, C., Hamel, J.S., Ashburn, P.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 362 KB

english, 2003

41

MOSFET gate leakage modeling and selection guide for alternative gate dielectrics based on leakage considerations

Yee-Chia Yeo, Tsu-Jae King, Chenming Hu

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 757 KB

english, 2003

42

Photothermal surface-micromachined actuators

Oliver, A.D., Vigil, S.R., Gianchandani, Y.B.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 263 KB

english, 2003

43

Compact distributed RLC interconnect models - part III: transients in single and coupled lines with capacitive load termination

Venkatesan, R., Davis, J.A., Meindl, J.D.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 962 KB

english, 2003

44

Compact distributed RLC interconnect models - part IV: unified models for time delay, crosstalk, and repeater insertion

Venkatesan, R., Davis, J.A., Meindl, J.D.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 753 KB

english, 2003

45

Extension and source/drain design for high-performance FinFET devices

Kedzierski, J., Meikei Ieong, Nowak, E., Kanarsky, T.S., Ying Zhang, Roy, R., Boyd, D., Fried, D., Wong, H.-S.P.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.12 MB

english, 2003

46

DC characterization of an InP-InGaAs tunneling emitter bipolar transistor (TEBT)

Chun-Yuan Chen, Shiou-Ying Cheng, Wen-Hui Chiou, Hung-Ming Chuang, Rong-Chau Liu, Chih-Hung Yen, Jing-Yuh Chen, Chin-Chuan Cheng, Wen-Chau Liu

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 508 KB

english, 2003