Determination of interface and bulk traps in the...

IEEE Transactions on Electron Devices 2003 Vol. 50; Iss. 9

Determination of interface and bulk traps in the subthreshold region of polycrystalline silicon thin-film transistors

Hastas, N.A., Tassis, D.H., Dimitriadis, C.A., Kamarinos, G.
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Volume:
50
Year:
2003
Language:
english
Pages:
4
DOI:
10.1109/ted.2003.815372
File:
PDF, 331 KB
english, 2003
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