A viable self-aligned bottom-gate MOS transistor technology for deep submicron 3-D SRAM
Shengdong Zhang, Chan, A.C.K., Ruqi Han, Ru Huang, Xiaoyan Liu, Yangyuan Wang, Ko, P.K., Mansun ChanVolume:
50
Year:
2003
Language:
english
Pages:
9
DOI:
10.1109/ted.2003.815859
File:
PDF, 1.03 MB
english, 2003