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Over-erase phenomenon in SONOS-type flash memory and its minimization using a hafnium oxide charge storage Layer
Yan-Ny Tan, Chim, W.-K., Byung Jin Cho, Wee-Kiong ChoiVolume:
51
Year:
2004
Language:
english
Pages:
5
DOI:
10.1109/ted.2004.829861
File:
PDF, 227 KB
english, 2004