Frequency and bias-dependent modeling of correlated base...

IEEE Transactions on Electron Devices 2006 Vol. 53; Iss. 3

Frequency and bias-dependent modeling of correlated base and collector current RF noise in SiGe HBTs using quasi-static equivalent circuit

Kejun Xia, Guofu Niu, Sheridan, D.C., Sweeney, S.L.
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Volume:
53
Year:
2006
Language:
english
Pages:
8
DOI:
10.1109/ted.2005.863537
File:
PDF, 538 KB
english, 2006
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