A microscopic interpretation of the RF noise performance of...

IEEE Transactions on Electron Devices 2006 Vol. 53; Iss. 3

A microscopic interpretation of the RF noise performance of fabricated FDSOI MOSFETs

Raul Rengel, Martin, M.J., Gonzalez, T., Mateos, J., Pardo, D., Dambrine, G., Raskin, J.-P., Danneville, F.
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Volume:
53
Year:
2006
Language:
english
Pages:
10
DOI:
10.1109/ted.2005.863541
File:
PDF, 757 KB
english, 2006
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