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Monte Carlo study of strained GermaniumNanoscale bulk pMOSFETs
Ghosh, B., Xiao-Feng Fan, Register, L.F., Banerjee, S.K.Volume:
53
Year:
2006
Language:
english
Pages:
5
DOI:
10.1109/ted.2005.863765
File:
PDF, 346 KB
english, 2006