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Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurement
Hong, Y.D., Yew Tong Yeow, Chim, W.K., Jian Yan, Kin Mun WongVolume:
53
Year:
2006
Language:
english
Pages:
8
DOI:
10.1109/ted.2005.864367
File:
PDF, 477 KB
english, 2006