Accurate modeling of the effects of fringing area interface...

Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurement

Hong, Y.D., Yew Tong Yeow, Chim, W.K., Jian Yan, Kin Mun Wong
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Volume:
53
Year:
2006
Language:
english
Pages:
8
DOI:
10.1109/ted.2005.864367
File:
PDF, 477 KB
english, 2006
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