![](/img/cover-not-exists.png)
A method to determine the gate bias-dependent and gate bias-independent components of MOSFET series resistance from S-parameters
Torres-Rios, E., Torres-Torres, R., Valdovinos-Fierro, G., Gutierrez-D, E.A.Volume:
53
Year:
2006
Language:
english
Pages:
3
DOI:
10.1109/ted.2006.870328
File:
PDF, 122 KB
english, 2006