Modeling of Variation in Submicrometer CMOS ULSI...

IEEE Transactions on Electron Devices 2006 Vol. 53; Iss. 9

Modeling of Variation in Submicrometer CMOS ULSI Technologies

Springer, S.K., Sungjae Lee, Ning Lu, Nowak, E.J., Plouchart, J.-O., Watts, J.S., Williams, R.Q., Zamdmer, N.
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Volume:
53
Year:
2006
Language:
english
Pages:
11
DOI:
10.1109/ted.2006.880165
File:
PDF, 818 KB
english, 2006
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