High-Frequency Noise of Modern MOSFETs: Compact Modeling...

IEEE Transactions on Electron Devices 2006 Vol. 53; Iss. 9

High-Frequency Noise of Modern MOSFETs: Compact Modeling and Measurement Issues

Deen, M.J., Chih-Hung Chen, Asgaran, S., Rezvani, G.A., Jon Tao, Kiyota, Y.
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Volume:
53
Year:
2006
Language:
english
Pages:
20
DOI:
10.1109/ted.2006.880370
File:
PDF, 1.62 MB
english, 2006
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