Root Cause of Charge Loss in a Nitride-Based Localized...

IEEE Transactions on Electron Devices 2007 Vol. 54; Iss. 6

Root Cause of Charge Loss in a Nitride-Based Localized Trapping Memory Cell

Furnemont, A., Rosmeulen, M., van der Zanden, K., Van Houdt, J., De Meyer, K., Maes, H.
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Volume:
54
Year:
2007
Language:
english
Pages:
9
DOI:
10.1109/ted.2007.895238
File:
PDF, 640 KB
english, 2007
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