Volume 54; Issue 6

IEEE Transactions on Electron Devices

Volume 54; Issue 6

1

Realization of a Four-Electrode Liquid Crystal Device With Full In-Plane Director Rotation

Desimpel, C., Beeckman, J., Neyts, K., Verstuyft, S., Van Thourhout, D., D'have, K., Rudquist, P.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 443 KB

english, 2007

2

Understanding Coulomb Effects in Nanoscale Schottky-Barrier-FETs

Indlekofer, K.M., Knoch, J., Appenzeller, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 584 KB

english, 2007

3

Root Cause of Charge Loss in a Nitride-Based Localized Trapping Memory Cell

Furnemont, A., Rosmeulen, M., van der Zanden, K., Van Houdt, J., De Meyer, K., Maes, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 640 KB

english, 2007

4

An 8 × 8 Pixel Array Pen-Input OLED Screen Based on Organic Magnetoresistance

Veeraraghavan, G., Nguyen, T.D., Yugang Sheng, Mermer, O., Wohlgenannt, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 311 KB

english, 2007

5

A Model of Fringing Fields in Short-Channel Planar and Triple-Gate SOI MOSFETs

Ernst, T., Ritzenthaler, R., Faynot, O., Cristoloveanu, S.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 988 KB

english, 2007

6

Modeling and Characterization of Hydrogen-Induced Charge Loss in Nitride-Trapping Memory

Yi-Lin Yang, Chia-Hua Chang, Yen-Hao Shih, Kuang-Yeu Hsieh, Jenn-Gwo Hwu

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 431 KB

english, 2007

7

Two-Dimensional Analytical Threshold Voltage and Subthreshold Swing Models of Undoped Symmetric Double-Gate MOSFETs

El Hamid, H.A., Guitart, J.R., Iniguez, B.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 455 KB

english, 2007

8

Source–Drain Partitioning in MOSFET

Roy, A.S., Enz, C.C., Sallese, J.-M.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 304 KB

english, 2007

9

High-Performance Chemical-Bath-Deposited Zinc Oxide Thin-Film Transistors

Redinger, D., Subramanian, V.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 768 KB

english, 2007

10

An Evaluation of Heat Dissipation Capability of Slow-Wave Structures

Yong Han, Yan-Wen Liu, Yao-Gen Ding, Pu-Kun Liu

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 326 KB

english, 2007

11

Transient Charging and Discharging Behaviors of Border Traps in the Dual-Layer HfO2/SiO2 High- κ Gate Stack Observed by Using Low-Frequency Charge Pumping Method

Wei-Hao Wu, Bing-Yue Tsui, Mao-Chieh Chen, Yong-Tian Hou, Yin Jin, Tao, H.-J., Shih-Chang Chen, Mong-Song Liang

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 415 KB

english, 2007

12

Nanocrystal Memory Cell Integration in a Stand-Alone 16-Mb nor Flash Device

Gerardi, C., Ancarani, V., Portoghese, R., Giuffrida, S., Bileci, M., Bimbo, G., Brafa, O., Mello, D., Ammendola, G., Tripiciano, E., Puglisi, R., Lombardo, S.A.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 435 KB

english, 2007

13

Low-Cost and Highly Manufacturable Strained-Si Channel Technique for Strong Hole Mobility Enhancement on 35-nm Gate Length pMOSFETs

Qiuxia Xu, Xiaofeng Duan, Haihua Liu, Zhengsheng Han, Tianchun Ye

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 627 KB

english, 2007

14

A Planar-Gate High-Conductivity IGBT (HiGT) With Hole-Barrier Layer

Mori, M., Oyama, K., Arai, T., Sakano, J., Nishimura, Y., Masuda, K., Saito, K., Uchino, Y., Homma, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 829 KB

english, 2007

15

Device-Optimization Technique for Robust and Low-Power FinFET SRAM Design in NanoScale Era

Bansal, A., Mukhopadhyay, S., Roy, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 897 KB

english, 2007

16

Experimental Investigation of Optimum Gate Workfunction for CMOS Four-Terminal Multigate MOSFETs (MUGFETs)

Masahara, M., Surdeanu, R., Witters, L., Doornbos, G., Nguyen, V.H., Van den bosch, G., Vrancken, C., Jurczak, M., Biesemans, S.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 1.19 MB

english, 2007

17

Multilevel Suspended Thin-Film Inductors on Silicon Wafers

Chih-Ming Tai, Chien-Neng Liao

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 356 KB

english, 2007

18

Germanium MOSFETs With CeO2/HfO2/ TiN Gate Stacks

Nicholas, G., Brunco, D.P., Dimoulas, A., Van Steenbergen, J., Bellenger, F., Houssa, M., Caymax, M., Meuris, M., Panayiotatos, Y., Sotiropoulos, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 380 KB

english, 2007

19

Analysis of Strain Effects in Ballistic Carbon Nanotube FETs

Yoon, Y., Jing Guo

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 898 KB

english, 2007

20

The Electrical Properties of Unidirectional Metal-Induced Lateral Crystallized Polycrystalline-Silicon Thin-Film Transistors

Nam-Kyu Song, Min-Sun Kim, Shin-Hee Han, Young-Su Kim, Seung-Ki Joo

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 532 KB

english, 2007

21

Spreading Antenna Effect of PID in Damascene Interconnect Process

Matsunaga, N., Yamaguchi, H., Shibata, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 828 KB

english, 2007

22

Separate Extraction of Gate Resistance Components in RF MOSFETs

Myounggon Kang, In Man Kang, Young Ho Jung, Hyungcheol Shin

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 360 KB

english, 2007

23

SrCaO Protective Layer for High-Efficiency PDPs

Motoyama, Y., Murakami, Y., Seki, M., Kurauchi, T., Kikuchi, N.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 436 KB

english, 2007

24

Impact of Pulsed Operation on Performance and Reliability of Flash Memories

Chimenton, A., Irrera, F., Olivo, P.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 374 KB

english, 2007

25

Scalability of Stress Induced by Contact-Etch-Stop Layers: A Simulation Study

Eneman, G., Verheyen, P., De Keersgieter, A., Jurczak, M., De Meyer, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 388 KB

english, 2007

26

A MEMS-Based Ionization Gas Sensor Using Carbon Nanotubes

Zhongyu Hou, Jiahao Wu, Weimin Zhou, Xing Wei, Dong Xu, Yafang Zhang, Bingchu Cai

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 505 KB

english, 2007

27

Spatial Distributions of Trapping Centers in HfO2/SiO2 Gate Stack

Heh, D., Young, C.D., Brown, G.A., Hung, P.Y., Diebold, A., Vogel, E.M., Bernstein, J.B., Bersuker, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 446 KB

english, 2007

28

Very High Carrier Mobility for High-Performance CMOS on a Si(110) Surface

Teramoto, A., Hamada, T., Yamamoto, M., Gaubert, P., Akahori, H., Nii, K., Hirayama, M., Arima, K., Endo, K., Sugawa, S., Ohmi, T.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 529 KB

english, 2007

29

Radiation-Enhanced Diffusion of Palladium for a Local Lifetime Control in Power Devices

Vobecky, J., Hazdra, P.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 247 KB

english, 2007

30

Highly Manufacturable Double-Gate FinFET With Gate-Source/Drain Underlap

Ji-Woon Yang, Zeitzoff, P.M., Hsing-Huang Tseng

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 366 KB

english, 2007

31

A CMOS Image Sensor Utilizing Opacity of Nanometallic Particles for DNA Detection

Yijin Wang, Chen Xu, Jiong Li, Jin He, Chan, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 609 KB

english, 2007

32

Revolutional Progress of Silicon Technologies Exhibiting Very High Speed Performance Over a 50-GHz Clock Rate

Ohmi, T., Teramoto, A., Kuroda, R., Miyamoto, N.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 797 KB

english, 2007

33

Impact of Scaling on the Inverse-Mode Operation of SiGe HBTs

Appaswamy, A., Bellini, M., Wei-Min Lance Kuo, Peng Cheng, Jiahui Yuan, Chendong Zhu, Cressler, J.D., Guofu Niu, Joseph, A.J.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 500 KB

english, 2007

34

Experimental Observation of Halo-Type Boundary Image Sticking in AC Plasma Display Panel

Choon-Sang Park, Heung-Sik Tae, Young-Kuk Kwon, Eun Gi Heo

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 746 KB

english, 2007

35

Analytic Carrier-Based Charge and Capacitance Model for Long-Channel Undoped Surrounding-Gate MOSFETs

Jin He, Wei Bian, Yadong Tao, Shengqi Yang, Xu Tang

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 366 KB

english, 2007

36

Compact Modeling of Lateral Nonuniform Doping in High-Voltage MOSFETs

Chauhan, Y.S., Krummenacher, F., Gillon, R., Bakeroot, B., Declercq, M.J., Ionescu, A.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 612 KB

english, 2007

37

Analog/RF Performance of Si Nanowire MOSFETs and the Impact of Process Variation

Runsheng Wang, Jing Zhuge, Ru Huang, Yu Tian, Han Xiao, Liangliang Zhang, Chen Li, Xing Zhang, Yangyuan Wang

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 1.17 MB

english, 2007

38

Electrical and Temperature Stress Effects on Class-AB Power Amplifier Performances

Chuanzhao Yu, Yuan, J.S.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 180 KB

english, 2007

39

Improvement of 4H-SiC Power p-i-n Diode Switching Performance Through Local Lifetime Control Using Boron Diffusion

Bolotnikov, A.V., Muzykov, P.G., Grekov, A.E., Sudarshan, T.S.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 477 KB

english, 2007

40

Enhancement-Mode AlN/GaN HFETs Using Cat-CVD SiN

Higashiwaki, M., Mimura, T., Matsui, T.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 261 KB

english, 2007

41

Simulation of Klystrons With Slow and Reflected Electrons Using Large-Signal Code TESLA

Chernyavskiy, I.A., Vlasov, A.N., Antonsen, T.M., Cooke, S.J., Levush, B., Nguyen, K.T.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 663 KB

english, 2007

42

A Comprehensive Tool for Modeling CMOS Image-Sensor-Noise Performance

Gow, R.D., Renshaw, D., Findlater, K., Grant, L., McLeod, S.J., Hart, J., Nicol, R.L.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 1.18 MB

english, 2007

43

Table of contents

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 56 KB

english, 2007

44

A New Look for IEEE Transactions on Electron Devices Briefs

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 22 KB

english, 2007

45

IEEE Transactions on Electron Devices publication information

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 60 KB

english, 2007

46

IEEE Transactions on Electron Devices information for authors

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 37 KB

english, 2007

47

Blank page [back cover]

Journal:

IEEE Transactions on Electron Devices

Year:

2007

File:

PDF, 2 KB

2007

48

Special issue on silicon carbide devices and technology

Journal:

IEEE Transactions on Electron Devices

Year:

2007

File:

PDF, 186 KB

2007

49

Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

Journal:

IEEE Transactions on Electron Devices

Year:

2007

File:

PDF, 236 KB

2007

50

Special issue on “Reliability of GaN, GaAs and related Compounds”

Journal:

IEEE Transactions on Electron Devices

Year:

2007

File:

PDF, 97 KB

2007

51

2007 IEEE Conference on Electron Devices and Solid-State Circuits

Journal:

IEEE Transactions on Electron Devices

Year:

2007

File:

PDF, 584 KB

2007

52

The 20th International Symposium on Power Semiconductors and ICs (ISPSD'08)

Journal:

IEEE Transactions on Electron Devices

Year:

2007

File:

PDF, 559 KB

2007

53

X11th International Seminar/Workshop Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED-2007)

Journal:

IEEE Transactions on Electron Devices

Year:

2007

File:

PDF, 478 KB

2007