Modeling and Characterization of Hydrogen-Induced Charge...

Modeling and Characterization of Hydrogen-Induced Charge Loss in Nitride-Trapping Memory

Yi-Lin Yang, Chia-Hua Chang, Yen-Hao Shih, Kuang-Yeu Hsieh, Jenn-Gwo Hwu
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Volume:
54
Year:
2007
Language:
english
Pages:
6
DOI:
10.1109/ted.2007.895242
File:
PDF, 431 KB
english, 2007
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