Transient Charging and Discharging Behaviors of Border Traps in the Dual-Layer HfO2/SiO2 High- κ Gate Stack Observed by Using Low-Frequency Charge Pumping Method
Wei-Hao Wu, Bing-Yue Tsui, Mao-Chieh Chen, Yong-Tian Hou, Yin Jin, Tao, H.-J., Shih-Chang Chen, Mong-Song LiangVolume:
54
Year:
2007
Language:
english
Pages:
8
DOI:
10.1109/ted.2007.895864
File:
PDF, 415 KB
english, 2007