A Physical Model on Scattering at High-κ Dielectric/SiO2 Interface of SiGe p-MOSFETs
Zhang, X.F., Xu, J.P., Lai, P.T., Li, C.X.Volume:
54
Year:
2007
Language:
english
Pages:
6
DOI:
10.1109/ted.2007.906957
File:
PDF, 249 KB
english, 2007