A Physical Model on Scattering at High-κ Dielectric/SiO2...

A Physical Model on Scattering at High-κ Dielectric/SiO2 Interface of SiGe p-MOSFETs

Zhang, X.F., Xu, J.P., Lai, P.T., Li, C.X.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
54
Year:
2007
Language:
english
Pages:
6
DOI:
10.1109/ted.2007.906957
File:
PDF, 249 KB
english, 2007
Conversion to is in progress
Conversion to is failed