A Compact Model for Polysilicon TFTs Leakage Current Including the Poole–Frenkel Effect
Wu, W.J., Yao, R.H., Li, S.H., Hu, Y.F., Deng, W.L., Zheng, X.R.Volume:
54
Year:
2007
Language:
english
Pages:
9
DOI:
10.1109/ted.2007.906968
File:
PDF, 606 KB
english, 2007