Device Design and Optimization Methodology for Leakage and Variability Reduction in Sub-45-nm FD/SOI SRAM
Mukhopadhyay, S., Keunwoo Kim, Ching-Te ChuangVolume:
55
Year:
2008
Language:
english
Pages:
11
DOI:
10.1109/ted.2007.911073
File:
PDF, 1.77 MB
english, 2008