Estimate Threshold Voltage Shift in a-Si:H TFTs Under...

IEEE Transactions on Electron Devices 2009 Vol. 56; Iss. 1

Estimate Threshold Voltage Shift in a-Si:H TFTs Under Increasing Bias Stress

Shou-En Liu, Chen-Pang Kung, Hou, J.
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Volume:
56
Year:
2009
Language:
english
Pages:
5
DOI:
10.1109/ted.2008.2008162
File:
PDF, 271 KB
english, 2009
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