IEEE Transactions on Electron Devices

1

A Charge-Based OTFT Model for Circuit Simulation

Torricelli, F., Kovacs-Vajna, Z.M., Colalongo, L.

Journal:

Year:

2009

Language:

english

File:

PDF, 322 KB

english, 2009

2

Proposal of Single Metal/Dual High- Devices for Aggressively Scaled CMISFETs With Precise Gate Profile Control

Mise, N., Morooka, T., Eimori, T., Ono, T., Sato, M., Kamiyama, S., Nara, Y., Ohji, Y.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 1.00 MB

english, 2009

3

Performance Improvement of Carbon-Nanotube-Incorporated Transparent Conducting Anode Film for Organic Device Application

Ke Lin, Kumar, R.S., Lai Szu Cheng, Chua Soo Jin

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 352 KB

english, 2009

4

Corrections to “Reducing the Power Consumption in the EL Displays”

Kang, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 94 KB

english, 2009

5

Asymmetric Schottky Tunneling Source SOI MOSFET Design for Mixed-Mode Applications

Jhaveri, R., Nagavarapu, V., Woo, J.C.S.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 706 KB

english, 2009

6

Estimate Threshold Voltage Shift in a-Si:H TFTs Under Increasing Bias Stress

Shou-En Liu, Chen-Pang Kung, Hou, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 271 KB

english, 2009

7

Epitaxial Optimization of 130-nm Gate-Length InGaAs/InAlAs/InP HEMTs for Low-Noise Applications

Malmkvist, M., Shumin Wang, Grahn, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 305 KB

english, 2009

8

SPICE Optimization of Organic FET Models Using Charge Transport Elements

Vaidya, V., Kim, J., Haddock, J.N., Kippelen, B., Wilson, D.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 257 KB

english, 2009

9

Physics of Carrier Backscattering in One- and Two-Dimensional Nanotransistors

Raseong Kim, Lundstrom, M.S.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 618 KB

english, 2009

10

Fringing-Induced Drain Current Improvement in the Tunnel Field-Effect Transistor With High- Gate Dielectrics

Schlosser, M., Bhuwalka, K.K., Sauter, M., Zilbauer, T., Sulima, T., Eisele, I.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 506 KB

english, 2009

11

A Model for Predicting On-Current Degradation Caused by Drain-Avalanche Hot Carriers in Low-Temperature Polysilicon Thin-Film Transistors

Kawamura, T., Matsumura, M., Kaitoh, T., Noda, T., Hatano, M., Miyazawa, T., Ohkura, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 397 KB

english, 2009

12

Electron Optics Simulator: A Three-Dimensional Finite-Element Electron Gun and Collector Design Tool

Tao Huang, Quan Hu, Zhong Hai Yang, Bin Li, Jian Qing Li, Xiao Lin Jin, Yu Lu Hu, Xiao Fang Zhu, Li Liao, Li Xiao, Guo Xian He

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 1.68 MB

english, 2009

13

Analysis of DC–RF Dispersion in AlGaN/GaN HFETs Using RF Waveform Engineering

Roff, C., Benedikt, J., Tasker, P.J., Wallis, D.J., Hilton, K.P., Maclean, J.O., Hayes, D.G., Uren, M.J., Martin, T.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 489 KB

english, 2009

14

Addressing Cu/Low- Dielectric TDDB-Reliability Challenges for Advanced CMOS Technologies

Fen Chen, Shinosky, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 970 KB

english, 2009

15

Measurement of Subnanosecond Delay Through Multiwall Carbon-Nanotube Local Interconnects in a CMOS Integrated Circuit

Close, G.F., Yasuda, S., Paul, B.C., Fujita, S., Wong, H.-S.P.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 701 KB

english, 2009

16

Effects of Hydrogenation on Optoelectronic Properties of a-C:H Thin-Film White-Light-Emitting Diodes With Composition-Graded Carrier-Injection Layers

Shih-Yung Lo, Rong-Hwei Yeh, Tai-Rong Yu, Jyh-Wong Hong

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 495 KB

english, 2009

17

MAGIC3D Simulations of a 500-W Ka-Band Coupled-Cavity Traveling-Wave Tube

Hae Jin Kim, Hyoung Jong Kim, Jin Joo Choi

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 985 KB

english, 2009

18

A General and Reliable Model for Charge Pumping—Part I: Model and Basic Charge-Pumping Mechanisms

Bauza, D.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 234 KB

english, 2009

19

A General and Reliable Model for Charge Pumping—Part II: Application to the Study of Traps in or in High- Gate Stacks

Bauza, D.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 438 KB

english, 2009

20

Photosensitivity Analysis of Low-Temperature Poly-Si Thin-Film Transistor Based on the Unit-Lux-Current

Ya-Hsiang Tai, Yan-Fu Kuo, Yun-Hsiang Lee

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 1.29 MB

english, 2009

21

Analytical Model of – Characteristics of Arbitrarily Shallow p-n Junctions

Popadic, M., Lorito, G., Nanver, L.K.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 739 KB

english, 2009

22

What Is in a Page Charge?

Jindal, R. P.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 27 KB

english, 2009

24

Corrections to “Zinc Oxide Nanostructures and High Electron Mobility Nanocomposite Thin Film Transistors” [Nov 08 3001-3011]

Li, F.M., Gen-Wen Hsieh, Dalal, S., Newton, M.C., Stott, J.E., Hiralal, P., Nathan, A., Warburton, P.A., Unalan, H.E., Beecher, P., Flewitt, A.J., Robinson, I., Amaratunga, G., Milne, W.I.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

Language:

english

File:

PDF, 94 KB

english, 2009

25

Corrections to “MOSFET Degradation Under RF Stress”

Sasse, G.T., Kuper, F.G., Schmitz, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2009

File:

PDF, 25 KB

2009

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