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Circuit-Level Impact of a-Si:H Thin-Film-Transistor Degradation Effects
Allee, D.R., Clark, L.T., Vogt, B.D., Shringarpure, R., Venugopal, S.M., Uppili, S.G., Kaftanoglu, K., Shivalingaiah, H., Li, Z.P., Ravindra Fernando, J.J., Bawolek, E.J., O'Rourke, S.M.Volume:
56
Year:
2009
Language:
english
Pages:
1
DOI:
10.1109/ted.2009.2019387
File:
PDF, 1.11 MB
english, 2009