Origin of the Flatband-Voltage Roll-Off Phenomenon in...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 9

Origin of the Flatband-Voltage Roll-Off Phenomenon in Metal/High- Gate Stacks

Bersuker, G., Chang Seo Park, Huang-Chun Wen, Choi, K., Price, J., Lysaght, P., Hsing-Huang Tseng, Sharia, O., Demkov, A., Ryan, J.T., Lenahan, P.
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Volume:
57
Year:
2010
Language:
english
Pages:
10
DOI:
10.1109/ted.2010.2051863
File:
PDF, 822 KB
english, 2010
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