Effects of Parasitics and Interface Traps on Ballistic...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 9

Effects of Parasitics and Interface Traps on Ballistic Nanowire FET in the Ultimate Quantum Capacitance Limit

Majumdar, K., Bhat, N., Majhi, P., Jammy, R.
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Volume:
57
Year:
2010
Language:
english
Pages:
10
DOI:
10.1109/ted.2010.2052171
File:
PDF, 1.12 MB
english, 2010
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